04-04-2025, 04:39 PM
![[Image: 539499712_359020115_tuto.jpg]](https://img100.pixhost.to/images/617/539499712_359020115_tuto.jpg)
237.72 MB | 3min 35s | mp4 | 1280X720 | 16:9
Genre:eLearning |Language:English
Files Included :
FileName :1 -Introduction.mp4 | Size: (4.83 MB)
FileName :2 -Bathtub curve v s Qualification in Foundry.mp4 | Size: (7.72 MB)
FileName :3 -What is WLR & the Importance.mp4 | Size: (11.94 MB)
FileName :4 -What WLR includes.mp4 | Size: (9.96 MB)
FileName :1 -FEOL Process Qualification.mp4 | Size: (4.61 MB)
FileName :2 -TDDB (Time Dependent Dielectric Breakdown) & Lifetime Model.mp4 | Size: (21.02 MB)
FileName :3 -Gox VBD (Gate Oxide Breakdown Voltage) & Defect Modes.mp4 | Size: (21.56 MB)
FileName :4 -PID (Plasma Induced Damage).mp4 | Size: (19.47 MB)
FileName :5 -HCI (Hot Carrier Injection) & Lifetime Model.mp4 | Size: (22.82 MB)
FileName :6 -BTI (Bias Temperature Instability) & Lifetime Model.mp4 | Size: (21.72 MB)
FileName :1 -BEOL Process Qualification.mp4 | Size: (4.42 MB)
FileName :2 -EM (Electro-Migration) & Lifetime Model.mp4 | Size: (28.66 MB)
FileName :3 -Quiz EM test resultlifetime model practice.mp4 | Size: (11.49 MB)
FileName :4 -SM (Stress Migration).mp4 | Size: (15.49 MB)
FileName :1 -Summary of Device Reliability Failure Mechanisms.mp4 | Size: (16.3 MB)
FileName :2 -End-to-End from WLR to Aging ModelSimulation to CLR.mp4 | Size: (6.5 MB)
FileName :1 -Ending Appreciation & Forecast.mp4 | Size: (9.2 MB)]
Screenshot
![[Image: I5qg3leJ_o.jpg]](https://images2.imgbox.com/d7/ac/I5qg3leJ_o.jpg)
FileName :1 -Introduction.mp4 | Size: (4.83 MB)
FileName :2 -Bathtub curve v s Qualification in Foundry.mp4 | Size: (7.72 MB)
FileName :3 -What is WLR & the Importance.mp4 | Size: (11.94 MB)
FileName :4 -What WLR includes.mp4 | Size: (9.96 MB)
FileName :1 -FEOL Process Qualification.mp4 | Size: (4.61 MB)
FileName :2 -TDDB (Time Dependent Dielectric Breakdown) & Lifetime Model.mp4 | Size: (21.02 MB)
FileName :3 -Gox VBD (Gate Oxide Breakdown Voltage) & Defect Modes.mp4 | Size: (21.56 MB)
FileName :4 -PID (Plasma Induced Damage).mp4 | Size: (19.47 MB)
FileName :5 -HCI (Hot Carrier Injection) & Lifetime Model.mp4 | Size: (22.82 MB)
FileName :6 -BTI (Bias Temperature Instability) & Lifetime Model.mp4 | Size: (21.72 MB)
FileName :1 -BEOL Process Qualification.mp4 | Size: (4.42 MB)
FileName :2 -EM (Electro-Migration) & Lifetime Model.mp4 | Size: (28.66 MB)
FileName :3 -Quiz EM test resultlifetime model practice.mp4 | Size: (11.49 MB)
FileName :4 -SM (Stress Migration).mp4 | Size: (15.49 MB)
FileName :1 -Summary of Device Reliability Failure Mechanisms.mp4 | Size: (16.3 MB)
FileName :2 -End-to-End from WLR to Aging ModelSimulation to CLR.mp4 | Size: (6.5 MB)
FileName :1 -Ending Appreciation & Forecast.mp4 | Size: (9.2 MB)]
Screenshot
![[Image: I5qg3leJ_o.jpg]](https://images2.imgbox.com/d7/ac/I5qg3leJ_o.jpg)
![[Image: signature.png]](https://softwarez.info/images/avsg/signature.png)


