Test Generation Of Crosstalk Delay Faults In VLSI Circuits

[Farid]

English | PDF,EPUB | 2018 (2019 Edition) | 161 Pages | ISBN : 9811324921 | 4.33 MB

Test Generation Of Crosstalk Delay Faults In VLSI Circuits (S. Jayanthy, M. C. Bhuvaneswari) (2019) English
Catergory: Computer Technology, Technology, Engineering, Nonfiction

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

🌞 Contents of Download:
📌 9811324921.epub (S. Jayanthy, M. C. Bhuvaneswari) (2019) (1.41 MB)
📌 9811324921.pdf (0009172) (2018) (2.92 MB)

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⭐️ Test Generation Of Crosstalk Delay Faults In VLSI Circuits ✅ (4.33 MB)
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