VLSI Design and Test

[ebooks1001]

Free Download VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers By Brajesh Kumar Kaushik
English | PDF | 2017 | 820 Pages | ISBN : 9811074690 | 96.5 MB
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.

The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
[/b]

Recommend Download Link Hight Speed | Please Say Thanks Keep Topic Live

[To see links please register or login]

Links are Interchangeable - Single Extraction