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Advanced Materials Characterization Techniques (Analytical) - OneDDL - 11-27-2024
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Free Download Advanced Materials Characterization Techniques (Analytical)
Published 11/2024
MP4 | Video: h264, 1920x1080 | Audio: AAC, 44.1 KHz
Language: English | Size: 3.47 GB | Duration: 7h 46m
From Microscopy to Spectroscopy: A Comprehensive Approach, Electron Microscopy, Thermal analysis, X-ray Diffraction
What you'll learn
Students will learn the fundamental principles of various advanced materials characterization techniques and describe their applications in Materials analysis
students will learn analyzing data from advanced techniques, demonstrating the ability to interpret results and correlate them with material properties
Students will be able to critically assess and select appropriate characterization techniques for different types of materials based on strengths and limitatons
Students will apply advanced characterization techniques to solve real-world materials challenges, demonstrating critical thinking and problem-solving skills
Requirements
No Specific Pre-Requisite. A general science background knowledge is sufficient
Description
This course provides an in-depth exploration of cutting-edge techniques used to characterize materials at the micro and nanoscale. Designed for graduate students and professionals in materials science, engineering, and related fields, the course will cover a range of advanced characterization methods, including:Electron Microscopy: Techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), Auger Electron Microscopy for high-resolution imaging and analysis.X-ray Diffraction (XRD): Understanding crystal structures and phase identification in materials.Spectroscopic Methods: in depth understanding of spectroscopic techniques like Raman Spectroscopy, energy dispersive x-ray spectroscopy, and x-ray photoelectron spectroscopy.Thermal Analysis: Exploring Differential Scanning Calorimetry (DSC), differential thermal analysis (DTA) and Thermogravimetric Analysis (TGA) to study thermal properties.Atomic Force Microscopy: Microscopy at the level will be studied through Atomic force microscopy commonly known as AFM.Through a series of lectures, and case studies, students will gain practical experience in selecting and applying the appropriate characterization techniques for various materials. The course will also emphasize the importance of data interpretation and the role of advanced characterization in materials development and innovation.By the end of the course, participants will be equipped with the skills and knowledge necessary to conduct comprehensive materials characterization, enabling them to contribute to advancements in material design and application across multiple industries.
Overview
Section 1: Introduction
Lecture 1 Introduction
Section 2: Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM)
Lecture 2 Introduction and Development of Electron Microscopy
Lecture 3 Kanaya Okayama Formula and Electron Matter interactions
Lecture 4 SEM Instrumentation and Working Principle
Lecture 5 SEM Instrumentation
Lecture 6 Transmission Electron Microscopy (TEM) Instrumentation and Working Principle
Lecture 7 Comparison of SEM and TEM
Section 3: Atomic Force Microscopy (AFM)
Lecture 8 Atomic force microscopy (AFM)-Atomic Forces
Lecture 9 Principle of AFM
Lecture 10 working of AFM
Lecture 11 Modes of AFM and comparison with other microscopies
Lecture 12 Limitations and Applications of AFM
Section 4: X-ray photoelectron spectroscoy (XPS) and Auger Electron Spectroscopy (AES)
Lecture 13 XPS- Photoelectric effect and X-rays
Lecture 14 Binding energy, kinetic energy and work function
Lecture 15 XPS-Instrumentation
Lecture 16 Phenomenon associated with XPS
Lecture 17 Chemical Shifts and Spin Orbit Coupling
Lecture 18 Final Shake Up and Shake off Effects
Lecture 19 Angle Resolved XPS
Section 5: Raman Spectroscopy
Lecture 20 Raman Spectroscopy, Raman Effects (Stokes and anti-Stokes Shift)
Lecture 21 Comparison of Raman with IR
Lecture 22 Raman Instrumentation
Section 6: Electron Energy Loss Spectroscopy
Lecture 23 Electron Energy Loss Spectroscopy
Lecture 24 Surface Plasmons and High energy Loss region
Lecture 25 White lines, Fine Edge Structure in XPS, Applications and Comparison with EDX
Lecture 26 EELS Spectral Analysis
Section 7: Energy Dispersive X-Ray Spectroscopy (EDS or EDX)
Lecture 27 EDX, Mechanism and Production of X-ray
Lecture 28 EDX Instrumentation
Lecture 29 EDX Instrumentations II and Applications of EDX
Section 8: X-ray Diffraction Analysis (XRD)
Lecture 30 XRD principle and Bragg's Equation
Lecture 31 XRD Instrumentation and Transmission Laue Method
Lecture 32 Rotating Crystal method and Powder method of XRD
Lecture 33 Spectral analysis of XRD and Small and Wide anlge Scattering (SAXS, WAXS)
Section 9: Thermogravimetric Analysis (TGA)
Lecture 34 Working Principle of TGA
Lecture 35 Instrumentaton of TGA with NULL and DEFLECTION Balanaces
Lecture 36 TGA instrumentation and factors affecting TGA Curve
Lecture 37 How to perform sample analysis on TGA
Section 10: Differential Thermal Analysis
Lecture 38 DTA principle, and Instrumentation
Lecture 39 DTA applications, factors affecting the analysis
Section 11: Differential Scanning Calorimetry
Lecture 40 Principle of DSC, DSC Types and Power Compensaton method
Lecture 41 Heat Flux Method and DSC Curves
Lecture 42 Factors affecting DSC and Applications of DSC
The course aims to provide a comprehensive understanding of advanced materials characterization techniques, enabling students to leverage these methods to advance their research, enhance material performance, and contribute to technological innovations. This course is particularly helpful for: Graduate Students, Research Professionals, Materials Scientists, Materials Engineers and Interdisciplinary scientist
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